{"id":397253,"date":"2024-10-20T04:29:11","date_gmt":"2024-10-20T04:29:11","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-1671-4-2007\/"},"modified":"2024-10-26T08:16:43","modified_gmt":"2024-10-26T08:16:43","slug":"ieee-1671-4-2007","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-1671-4-2007\/","title":{"rendered":"IEEE 1671.4-2007"},"content":{"rendered":"

New IEEE Standard – Superseded. This document specifies an exchange format, utilizing XML, for identifying the test configuration used to test and diagnose a unit under test (UUT) on an automatic test system (ATS).<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
1<\/td>\nIEEE Std 1671.4\u2122-2007 Front Cover <\/td>\n<\/tr>\n
3<\/td>\nTitle page <\/td>\n<\/tr>\n
5<\/td>\nImportant Notices and Disclaimers Concerning IEEE Standards Documents <\/td>\n<\/tr>\n
8<\/td>\nParticipants <\/td>\n<\/tr>\n
10<\/td>\nIntroduction <\/td>\n<\/tr>\n
13<\/td>\nImportant Notice
1. Overview <\/td>\n<\/tr>\n
14<\/td>\n1.1 Scope
1.2 Purpose
1.3 Application
1.4 Conventions used within this document <\/td>\n<\/tr>\n
15<\/td>\n2. Normative references <\/td>\n<\/tr>\n
16<\/td>\n3. Definitions, acronyms, and abbreviations
3.1 Definitions <\/td>\n<\/tr>\n
17<\/td>\n3.2 Acronyms and abbreviations <\/td>\n<\/tr>\n
18<\/td>\n4. Schema\u2014TestConfiguration.xsd
4.1 General
4.2 Elements <\/td>\n<\/tr>\n
20<\/td>\n4.3 Child elements <\/td>\n<\/tr>\n
26<\/td>\n4.4 Complex types <\/td>\n<\/tr>\n
28<\/td>\n4.5 Inherited simple types
4.6 Inherited complex types <\/td>\n<\/tr>\n
29<\/td>\n4.7 Inherited attribute groups
5. Instance schema\u2014None
6. Conformance
7. Extensibility <\/td>\n<\/tr>\n
30<\/td>\nAnnex A (informative) TestConfiguration instance documents (.XML files)
A.1 General
A.2 Root element
A.3 Example <\/td>\n<\/tr>\n
31<\/td>\nAnnex B (informative) Users information and examples
B.1 UUT testing element itemization <\/td>\n<\/tr>\n
32<\/td>\nB.2 TestConfig.xml example <\/td>\n<\/tr>\n
33<\/td>\nAnnex C (informative) Glossary <\/td>\n<\/tr>\n
34<\/td>\nAnnex D (informative) Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
IEEE<\/b><\/a><\/td>\n2007<\/td>\n34<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":397256,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2644],"product_tag":[],"class_list":{"0":"post-397253","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-ieee","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/397253","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/397256"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=397253"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=397253"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=397253"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}