{"id":361660,"date":"2024-10-20T01:37:00","date_gmt":"2024-10-20T01:37:00","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-20794-72020\/"},"modified":"2024-10-26T02:30:36","modified_gmt":"2024-10-26T02:30:36","slug":"bs-iso-20794-72020","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-20794-72020\/","title":{"rendered":"BS ISO 20794-7:2020"},"content":{"rendered":"

This document specifies the conformance test plans for the CXPI data link layer and the CXPI physical layer. It also specifies the conformance test plan for error detection.<\/p>\n

Additionally, this document describes the concept of conformance test plan operation.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
2<\/td>\nundefined <\/td>\n<\/tr>\n
8<\/td>\nForeword <\/td>\n<\/tr>\n
9<\/td>\nIntroduction <\/td>\n<\/tr>\n
11<\/td>\n1 Scope
2 Normative references
3 Terms and definitions
4 Symbols and abbreviated terms
4.1 Symbols <\/td>\n<\/tr>\n
12<\/td>\n4.2 Abbreviated terms <\/td>\n<\/tr>\n
13<\/td>\n5 Conventions
6 General test specification considerations
6.1 General <\/td>\n<\/tr>\n
14<\/td>\n6.2 Test conditions
6.3 IUT requirements
6.4 CTC definition <\/td>\n<\/tr>\n
15<\/td>\n6.5 Test system set-up <\/td>\n<\/tr>\n
16<\/td>\n6.6 Configuration of test system and IUT
6.6.1 General <\/td>\n<\/tr>\n
17<\/td>\n6.6.2 IUT-specific set-up parameters <\/td>\n<\/tr>\n
18<\/td>\n6.6.3 Default configurations
6.6.4 L_ErrDet1 configurations
6.6.5 L_ErrDet2 configurations
6.6.6 L_Arbit configurations
6.6.7 L_Unknown configurations
6.7 SUT initialisation <\/td>\n<\/tr>\n
19<\/td>\n6.8 Additional test system set-up capabilities
6.8.1 CXPI network data generator <\/td>\n<\/tr>\n
21<\/td>\n6.8.2 TXD data generator <\/td>\n<\/tr>\n
23<\/td>\n6.8.3 TXPWM data generator <\/td>\n<\/tr>\n
24<\/td>\n6.8.4 RXPWM data generator <\/td>\n<\/tr>\n
26<\/td>\n6.8.5 Other requirements
7 Data link layer conformance test plan
7.1 General
7.2 CTP \u2013 Timing parameters
7.2.1 2.CTC_1.1 \u2013 IBS length <\/td>\n<\/tr>\n
27<\/td>\n7.2.2 2.CTC_1.2 \u2013 IFS length <\/td>\n<\/tr>\n
28<\/td>\n7.2.3 2.CTC_1.3 \u2013 Frame reception starting condition 1 without the error bit
7.2.4 2.CTC_1.4 \u2013 Frame reception starting condition 1 with the error bit <\/td>\n<\/tr>\n
29<\/td>\n7.2.5 2.CTC_1.5 \u2013 Frame reception starting condition 2 without the error bit <\/td>\n<\/tr>\n
30<\/td>\n7.2.6 2.CTC_1.6 \u2013 Frame reception starting condition 2 with the error bit
7.2.7 2.CTC_1.7 \u2013 Frame reception starting condition 3 <\/td>\n<\/tr>\n
31<\/td>\n7.2.8 2.CTC_1.8 \u2013 Maximum length of the frame <\/td>\n<\/tr>\n
32<\/td>\n7.3 CTP \u2013 Frame transmission\/reception
7.3.1 2.CTC_2.1 \u2013 Response to L_PID field <\/td>\n<\/tr>\n
33<\/td>\n7.3.2 2.CTC_2.2 \u2013 L_PID field transmission
7.3.3 2.CTC_2.3 \u2013 L_PTYPE field transmission <\/td>\n<\/tr>\n
34<\/td>\n7.3.4 2.CTC_2.4 \u2013 L_PTYPE field response function <\/td>\n<\/tr>\n
35<\/td>\n7.3.5 2.CTC_2.5 \u2013 L_FI_DLC \u2260 11112 and frame data verification 1 <\/td>\n<\/tr>\n
36<\/td>\n7.3.6 2.CTC_2.6 \u2013 L_FI_DLC \u2260 11112 and frame data verification 2 if DLC is 11012 or 11102 (Ftype = NormalCom) <\/td>\n<\/tr>\n
37<\/td>\n7.3.7 2.CTC_2.7 \u2013 L_FI_DLC = 11112\/L_FI_DLCext \u2265 0 and frame data verification <\/td>\n<\/tr>\n
38<\/td>\n7.3.8 2.CTC_2.8 \u2013 Given CRC of frame with L_FI_DLC \u2260 11112 <\/td>\n<\/tr>\n
39<\/td>\n7.3.9 2.CTC_2.9 \u2013 Given CRC of frame with L_FI_DLC = 11112\/L_FI_DLCext \u2265 0 <\/td>\n<\/tr>\n
40<\/td>\n7.3.10 2.CTC_2.10 \u2013 Frame transmission completion
7.3.11 2.CTC_2.11 \u2013 Frame reception completion <\/td>\n<\/tr>\n
41<\/td>\n7.4 CTP \u2013 Network access
7.4.1 2.CTC_3.1 \u2013 Arbitration function 1 (arbitration by using carrier sense) <\/td>\n<\/tr>\n
42<\/td>\n7.4.2 2.CTC_3.2 \u2013 Arbitration function 2 (IUT loses arbitration and transitions into receiving state) <\/td>\n<\/tr>\n
43<\/td>\n7.5 CTP \u2013 Error detection
7.5.1 2.CTC_4.1 \u2013 Byte error <\/td>\n<\/tr>\n
45<\/td>\n7.5.2 2.CTC_4.2 \u2013 CRC error <\/td>\n<\/tr>\n
46<\/td>\n7.5.3 2.CTC_4.3 \u2013 Parity error of the L_PID field without the error bit <\/td>\n<\/tr>\n
47<\/td>\n7.5.4 2.CTC_4.4 \u2013 Parity error of the L_PID field with the error bit
7.5.5 2.CTC_4.5 \u2013 Parity error of the L_PTYPE field without the error bit <\/td>\n<\/tr>\n
48<\/td>\n7.5.6 2.CTC_4.6 \u2013 Parity error of the L_PTYPE field with the error bit <\/td>\n<\/tr>\n
49<\/td>\n7.5.7 2.CTC_4.7 \u2013 Data length code error with L_FI_DLC \u2260 11112 <\/td>\n<\/tr>\n
50<\/td>\n7.5.8 2.CTC_4.8 \u2013 Data length error with L_FI_DLC = 11112\/L_FI_DLCext \u2265 0 <\/td>\n<\/tr>\n
51<\/td>\n7.5.9 2.CTC_4.9 \u2013 Data length code error L_FI_DLC \u2260 11112 and if DLC is 11012 or 11102 (Ftype = DiagNodeCfg) <\/td>\n<\/tr>\n
52<\/td>\n7.5.10 2.CTC_4.10 \u2013 Data length code error L_FI_DLC = 11112\/L_FI_DLCext \u2264 12 (Ftype = DiagNodeCfg) <\/td>\n<\/tr>\n
53<\/td>\n7.5.11 2.CTC_4.11 \u2013 Framing error in receiving node <\/td>\n<\/tr>\n
54<\/td>\n7.5.12 2.CTC_4.12 \u2013 Framing error in transmitting node
7.5.13 2.CTC_4.13 \u2013 Ignore error (no support of L_FI_DLC = 11112) <\/td>\n<\/tr>\n
55<\/td>\n8 Physical layer conformance test plan (PMA \u2013 PS separate type)
8.1 CTP \u2013 Operational conditions and calibration
8.1.1 Initial configuration <\/td>\n<\/tr>\n
56<\/td>\n8.1.2 1.CTC_1.1 \u2013 Clock transmission 1 <\/td>\n<\/tr>\n
57<\/td>\n8.1.3 1.CTC_1.2 \u2013 Clock transmission 2 <\/td>\n<\/tr>\n
59<\/td>\n8.1.4 1.CTC_1.3 \u2013 Clock transmission 3 <\/td>\n<\/tr>\n
61<\/td>\n8.1.5 1.CTC_1.4 \u2013 Detection of clock existence <\/td>\n<\/tr>\n
62<\/td>\n8.1.6 1.CTC_1.5 \u2013 Arbitration function (stop transmission by arbitration) <\/td>\n<\/tr>\n
64<\/td>\n8.1.7 1.CTC_1.6 \u2013 Operating voltage range <\/td>\n<\/tr>\n
65<\/td>\n8.1.8 1.CTC_1.7 \u2013 Bit synchronisation <\/td>\n<\/tr>\n
67<\/td>\n8.2 CTP \u2013 Wake-up pulse
8.2.1 General
8.2.2 1.CTC_2.1 \u2013 Wake-up pulse reception 1, IUT as master node <\/td>\n<\/tr>\n
69<\/td>\n8.2.3 1.CTC_2.2 \u2013 Wake-up pulse reception 2, IUT as slave node <\/td>\n<\/tr>\n
71<\/td>\n8.2.4 1.CTC_2.3 \u2013 Wake-up pulse transmission <\/td>\n<\/tr>\n
73<\/td>\n8.3 CTP \u2013 Voltage and duty cycle thresholds
8.3.1 General
8.3.2 Voltage threshold test set-up
8.3.3 1.CTC_3.1 \u2013 Voltage threshold test 1 <\/td>\n<\/tr>\n
74<\/td>\n8.3.4 1.CTC_3.2 \u2013 Voltage threshold (VDom_TS up) test 2 <\/td>\n<\/tr>\n
76<\/td>\n8.3.5 1.CTC_3.2 \u2013 Voltage threshold test 2 <\/td>\n<\/tr>\n
77<\/td>\n8.3.6 1.CTC_3.3 \u2013 Duty cycle threshold test 1 <\/td>\n<\/tr>\n
78<\/td>\n8.3.7 1.CTC_3.4 \u2013 Duty cycle threshold test 2 <\/td>\n<\/tr>\n
79<\/td>\n8.4 CTP \u2013 Network state current characteristics
8.4.1 1.CTC_4.1 \u2013 Drive current test <\/td>\n<\/tr>\n
81<\/td>\n8.4.2 1.CTC_4.2 \u2013 Input leakage test <\/td>\n<\/tr>\n
82<\/td>\n8.4.3 1.CTC_4.3 \u2013 Reverse leakage current test <\/td>\n<\/tr>\n
83<\/td>\n8.5 CTP \u2013 Physical signal slope control
8.5.1 1.CTC_5.1 \u2013 Duty cycle measurement 1 <\/td>\n<\/tr>\n
85<\/td>\n8.5.2 1.CTC_5.2 \u2013 Duty cycle measurement 2 <\/td>\n<\/tr>\n
87<\/td>\n8.5.3 1.CTC_5.3 \u2013 Duty cycle measurement 3 <\/td>\n<\/tr>\n
88<\/td>\n8.5.4 1.CTC_5.4 \u2013 Propagation delay of the receiver test <\/td>\n<\/tr>\n
90<\/td>\n8.5.5 1.CTC_5.5 \u2013 Propagation delay of the transmitter test <\/td>\n<\/tr>\n
92<\/td>\n8.5.6 1.CTC_5.6 \u2013 Propagation delay of the transmitter test 2 <\/td>\n<\/tr>\n
94<\/td>\n8.5.7 1.CTC_5.7 \u2013 Loop back time test <\/td>\n<\/tr>\n
95<\/td>\n8.6 CTP \u2013 GND\/VBAT shift test
8.6.1 GND\/VBAT shift test set-up <\/td>\n<\/tr>\n
96<\/td>\n8.6.2 1.CTC_6.1 \u2013 GND shift test <\/td>\n<\/tr>\n
97<\/td>\n8.6.3 1.CTC_6.2 \u2013 VBAT shift test <\/td>\n<\/tr>\n
98<\/td>\n8.7 CTP \u2013 Loss of power supply
8.7.1 Loss of battery and Loss of GND test set-up <\/td>\n<\/tr>\n
99<\/td>\n8.7.2 1.CTC_7.1 \u2013 Loss of battery test (VBAT) <\/td>\n<\/tr>\n
100<\/td>\n8.7.3 1.CTC_7.2 \u2013 Loss of GND test <\/td>\n<\/tr>\n
101<\/td>\n8.8 CTP \u2013 Internal static capacity
8.8.1 Internal static capacity test set-up <\/td>\n<\/tr>\n
102<\/td>\n8.8.2 1.CTC_8.1 Internal static capacity <\/td>\n<\/tr>\n
104<\/td>\n8.9 CTP \u2013 Internal resistance measurement during operation
8.9.1 Internal resistor measurement test set-up <\/td>\n<\/tr>\n
105<\/td>\n8.9.2 1.CTC_9.1\u2013 Internal resistor measurement 1 <\/td>\n<\/tr>\n
106<\/td>\n8.9.3 1.CTC_9.2\u2013 Internal resistor measurement 2 <\/td>\n<\/tr>\n
107<\/td>\n9 Physical layer conformance test plan (PS \u2013PMA non-separate type)
9.1 CTP \u2013 Operational conditions and calibration
9.1.1 1.CTC_10.1 \u2013 Clock transmission <\/td>\n<\/tr>\n
109<\/td>\n9.1.2 1.CTC_10.2 \u2013 Detection of clock existence <\/td>\n<\/tr>\n
110<\/td>\n9.1.3 1.CTC_10.3 \u2013 Arbitration function (stop transmission by arbitration) <\/td>\n<\/tr>\n
111<\/td>\n9.1.4 1.CTC_10.4 \u2013 Operating voltage range <\/td>\n<\/tr>\n
112<\/td>\n9.2 CTP \u2013 Wake-up pulse
9.2.1 General
9.2.2 1.CTC_11.1 \u2013 Wake-up pulse reception, IUT as master node <\/td>\n<\/tr>\n
113<\/td>\n9.2.3 1.CTC_11.2 \u2013 Wake-up by clock detection <\/td>\n<\/tr>\n
114<\/td>\n9.2.4 1.CTC_11.3 \u2013 Wake-up pulse transmission <\/td>\n<\/tr>\n
115<\/td>\n9.3 CTP \u2013 Voltage and duty cycle thresholds
9.3.1 General
9.3.2 1.CTC_12.1 \u2013 Voltage threshold test 1 <\/td>\n<\/tr>\n
117<\/td>\n9.3.3 1.CTC_12.2 \u2013 Voltage threshold test 2 <\/td>\n<\/tr>\n
118<\/td>\n9.3.4 1.CTC_12.3 \u2013 Duty cycle threshold test 1 <\/td>\n<\/tr>\n
121<\/td>\n9.3.5 1.CTC_12.4 \u2013 Duty cycle threshold test 2 <\/td>\n<\/tr>\n
122<\/td>\n9.4 CTP \u2013 Network state current characteristics
9.4.1 1.CTC_13.1 \u2013 Drive current test <\/td>\n<\/tr>\n
124<\/td>\n9.4.2 1.CTC_13.2 \u2013 Input leakage test <\/td>\n<\/tr>\n
125<\/td>\n9.4.3 1.CTC_13.3 \u2013 Reverse leakage current test <\/td>\n<\/tr>\n
126<\/td>\n9.5 CTP \u2013 Physical signal slope control
9.5.1 1.CTC_14.1 \u2013 Duty cycle measurement 1 <\/td>\n<\/tr>\n
128<\/td>\n9.5.2 1.CTC_14.2 \u2013 Duty cycle measurement 2 <\/td>\n<\/tr>\n
130<\/td>\n9.6 CTP \u2013 GND\/VBAT shift test
9.6.1 GND\/VBAT shift test set-up <\/td>\n<\/tr>\n
131<\/td>\n9.6.2 1.CTC_15.1 \u2013 GND shift test <\/td>\n<\/tr>\n
132<\/td>\n9.6.3 1.CTC_15.2 \u2013 VBAT shift test <\/td>\n<\/tr>\n
133<\/td>\n9.7 CTP \u2013 Loss of power supply
9.7.1 General
9.7.2 Loss of battery (VBAT) and GND test set-up <\/td>\n<\/tr>\n
134<\/td>\n9.7.3 1.CTC_16.1 \u2013 Loss of battery test (VBAT) <\/td>\n<\/tr>\n
135<\/td>\n9.7.4 1.CTC_16.2 \u2013 Loss of GND test <\/td>\n<\/tr>\n
136<\/td>\n9.8 CTP \u2013 Internal static capacity
9.8.1 Internal static capacity test set-up <\/td>\n<\/tr>\n
137<\/td>\n9.8.2 1.CTC_17.1 Internal static capacity <\/td>\n<\/tr>\n
139<\/td>\n9.9 CTP \u2013 Internal resistance measurement during operation
9.9.1 Internal resistor measurement test set-up <\/td>\n<\/tr>\n
140<\/td>\n9.9.2 1.CTC_18.1\u2013 Internal resistor measurement 1 <\/td>\n<\/tr>\n
141<\/td>\n9.9.3 1.CTC_18.2\u2013 Internal resistor measurement 2 <\/td>\n<\/tr>\n
143<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Road vehicles. Clock extension peripheral interface (CXPI) – Data link and physical layer conformance test plan<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2020<\/td>\n144<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":361671,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[742,2641],"product_tag":[],"class_list":{"0":"post-361660","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-43-040-15","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/361660","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/361671"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=361660"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=361660"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=361660"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}