IEEE 1671.4-2007
$62.83
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information
| Published By | Publication Date | Number of Pages |
| IEEE | 2007 | 34 |
New IEEE Standard – Superseded. This document specifies an exchange format, utilizing XML, for identifying the test configuration used to test and diagnose a unit under test (UUT) on an automatic test system (ATS).
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | IEEE Std 1671.4ā¢-2007 Front Cover |
| 3 | Title page |
| 5 | Important Notices and Disclaimers Concerning IEEE Standards Documents |
| 8 | Participants |
| 10 | Introduction |
| 13 | Important Notice 1. Overview |
| 14 | 1.1 Scope 1.2 Purpose 1.3 Application 1.4 Conventions used within this document |
| 15 | 2. Normative references |
| 16 | 3. Definitions, acronyms, and abbreviations 3.1 Definitions |
| 17 | 3.2 Acronyms and abbreviations |
| 18 | 4. SchemaāTestConfiguration.xsd 4.1 General 4.2 Elements |
| 20 | 4.3 Child elements |
| 26 | 4.4 Complex types |
| 28 | 4.5 Inherited simple types 4.6 Inherited complex types |
| 29 | 4.7 Inherited attribute groups 5. Instance schemaāNone 6. Conformance 7. Extensibility |
| 30 | Annex A (informative) TestConfiguration instance documents (.XML files) A.1 General A.2 Root element A.3 Example |
| 31 | Annex B (informative) Users information and examples B.1 UUT testing element itemization |
| 32 | B.2 TestConfig.xml example |
| 33 | Annex C (informative) Glossary |
| 34 | Annex D (informative) Bibliography |
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