{"id":420657,"date":"2024-10-20T06:32:14","date_gmt":"2024-10-20T06:32:14","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iec-62899-402-12017\/"},"modified":"2024-10-26T12:13:45","modified_gmt":"2024-10-26T12:13:45","slug":"bs-iec-62899-402-12017","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iec-62899-402-12017\/","title":{"rendered":"BS IEC 62899-402-1:2017"},"content":{"rendered":"
This part of IEC 62899 specifies the measurement methods of the widths of the printed patterns in printed electronics. These printed pattern widths are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for thickness in printed electronics.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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4<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
5<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 4 Atmospheric conditions for evaluation and conditioning 5 Measuring methods and instruments 5.1 Measuring instrument 5.2 Preparation of imaging (specimen) 5.3 Measuring method <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 5.4 Obtaining width and related attributes Figure 1 \u2013 Captured image of two edges of pattern and inner\/outer edge lines Figure 2 \u2013 Obtained position difference as a function of y <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 6 Report of results 6.1 Measurement identification information 6.2 Instrument system and its specification 6.3 Measuring position 6.4 Results <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | Table 1 \u2013 Example of reporting items <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | Annex A (normative) Drawing method of inner edge lines and outer edge lines <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Printed electronics – Printability. Measurement of qualities. Pattern width<\/b><\/p>\n |