{"id":389396,"date":"2024-10-20T03:49:51","date_gmt":"2024-10-20T03:49:51","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bsi-pd-iso-ts-233022021\/"},"modified":"2024-10-26T07:01:45","modified_gmt":"2024-10-26T07:01:45","slug":"bsi-pd-iso-ts-233022021","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bsi-pd-iso-ts-233022021\/","title":{"rendered":"BSI PD ISO\/TS 23302:2021"},"content":{"rendered":"
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
2<\/td>\n | National foreword <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | Foreword <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions 3.1 General core terms <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 3.2 Measurand related terms <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 4 Abbreviated terms <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | 5 Approaches to identify measurands to characterize nano-objects and their agglomerates and aggregates, and materials containing nano-objects 5.1 Procedure <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | 5.2 Types of measurands 5.3 State of nano-objects 6 Measurands related to size and shape measurement of nano-objects and their agglomerates and aggregates 6.1 General <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | 6.2 Measurands related to size and shape measurement 6.2.1 Overview <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | 6.2.2 General relevant standards 6.3 Measurands related to size and shape measurement in aerosols 6.3.1 Overview <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | 6.3.2 General relevant standards 6.3.3 Electrical low-pressure impaction <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | 6.3.4 Cascade impactors 6.3.5 Differential mobility analysing system <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | 6.3.6 Relevant standards 6.3.7 Optical particle counter 6.3.8 Relevant standards 6.3.9 Aerodynamic particle sizing 6.3.10 TEM combined with TEM grid samplers <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | 6.3.11 Relevant standards 6.3.12 Scanning electron microscopy <\/td>\n<\/tr>\n | ||||||
27<\/td>\n | 6.3.13 Relevant standards 6.4 Measurands related to size and shape measurement in powders 6.4.1 Overview 6.4.2 Relevant standards <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | 6.4.3 Scanning electron microscopy 6.4.4 Relevant standards 6.4.5 Gas adsorption, the BET method 6.4.6 Relevant standard 6.4.7 Laser diffraction <\/td>\n<\/tr>\n | ||||||
29<\/td>\n | 6.4.8 Relevant standard 6.4.9 X-ray diffraction 6.4.10 Relevant standards 6.4.11 Raman spectroscopy <\/td>\n<\/tr>\n | ||||||
30<\/td>\n | 6.5 Measurands related to size and shape measurements of nano-objects in liquid dispersions 6.5.1 Overview <\/td>\n<\/tr>\n | ||||||
31<\/td>\n | 6.5.2 Centrifugal liquid sedimentation 6.5.3 Relevant standards 6.5.4 Dynamic light scattering <\/td>\n<\/tr>\n | ||||||
32<\/td>\n | 6.5.5 Relevant standards 6.5.6 Laser diffraction 6.5.7 Relevant standard 6.5.8 Small angle X-ray scattering 6.5.9 Relevant standard 6.5.10 Particle tracking analysis <\/td>\n<\/tr>\n | ||||||
33<\/td>\n | 6.5.11 Relevant standards 6.5.12 Electron microscopy 6.5.13 Field flow fractionation <\/td>\n<\/tr>\n | ||||||
34<\/td>\n | 6.5.14 Relevant standard 6.5.15 Single particle ICP-MS <\/td>\n<\/tr>\n | ||||||
35<\/td>\n | 6.5.16 Relevant standard 6.6 Measurands related to size and shape measurement on surfaces (microscopy techniques) 6.6.1 Overview 6.6.2 Scanning electron microscopy 6.6.3 Atomic force microscopy <\/td>\n<\/tr>\n | ||||||
36<\/td>\n | 6.6.4 Relevant standards 7 Measurands related to chemical analysis of nano-objects and their agglomerates and aggregates 7.1 General <\/td>\n<\/tr>\n | ||||||
37<\/td>\n | 7.2 Measurands related to surface chemical analysis of nano-objects and their agglomerates and aggregates 7.2.1 Measurands <\/td>\n<\/tr>\n | ||||||
38<\/td>\n | 7.2.2 Auger electron spectroscopy 7.2.3 Relevant standards 7.2.4 Electron energy loss spectroscopy 7.2.5 Relevant standard 7.2.6 Secondary ion mass spectroscopy <\/td>\n<\/tr>\n | ||||||
39<\/td>\n | 7.2.7 Relevant standards 7.2.8 X-ray fluorescence spectroscopy <\/td>\n<\/tr>\n | ||||||
40<\/td>\n | 7.2.9 Relevant standards 7.2.10 X-ray diffraction 7.2.11 Relevant standard 7.2.12 X-ray photoelectron spectroscopy <\/td>\n<\/tr>\n | ||||||
41<\/td>\n | 7.2.13 Relevant standards 7.2.14 Energy dispersive X-ray spectroscopy 7.2.15 Low energy ion scattering 7.3 Measurands related to the chemical analysis of nano-objects as bulk samples 7.3.1 Measurands <\/td>\n<\/tr>\n | ||||||
42<\/td>\n | 7.3.2 Fourier transform infrared spectroscopy <\/td>\n<\/tr>\n | ||||||
43<\/td>\n | 7.3.3 Relevant standards 7.3.4 Thermal analysis with evolved gas analyser plus FTIR or QMS <\/td>\n<\/tr>\n | ||||||
44<\/td>\n | 7.3.5 Relevant standards 7.3.6 Ultraviolet\u2013visible spectroscopy 7.3.7 Relevant standards 7.3.8 Raman spectroscopy 7.3.9 Inductively coupled plasma techniques 7.3.10 Relevant standards <\/td>\n<\/tr>\n | ||||||
45<\/td>\n | 7.3.11 Contact angle 8 Measurands related to mass and density 8.1 General 8.2 Aerosols 8.2.1 Measurands 8.2.2 Relevant standards <\/td>\n<\/tr>\n | ||||||
46<\/td>\n | 8.2.3 Aerosol particle mass analyser 8.2.4 Time of flight mass spectrometry 8.3 Powders 8.3.1 Measurands 8.3.2 Pycnometry 8.3.3 Relevant standards <\/td>\n<\/tr>\n | ||||||
47<\/td>\n | 8.4 Liquid dispersions 8.4.1 Measurands 8.4.2 Relevant standards 8.4.3 Centrifugal liquid sedimentation (isopycnic method) 8.4.4 Static light scattering <\/td>\n<\/tr>\n | ||||||
48<\/td>\n | 8.4.5 Resonant mass measurement 9 Measurands related to charge \u2014 Liquid dispersions 9.1 Measurands 9.2 Relevant standards 9.3 Electrophoretic light scattering <\/td>\n<\/tr>\n | ||||||
49<\/td>\n | 9.4 Electroacoustic phenomena measurements 10 Measurands related to crystallinity 10.1 Measurands <\/td>\n<\/tr>\n | ||||||
50<\/td>\n | 10.2 Small-angle\/wide-angle X-ray scattering 10.3 X-ray diffraction <\/td>\n<\/tr>\n | ||||||
51<\/td>\n | 10.4 High-resolution transmission electron microscopy 10.5 Electron backscattered diffraction 10.6 Neutron diffraction 10.7 Reflection high-energy electron diffraction and low-energy electron diffraction 10.8 Differential scanning calorimetry <\/td>\n<\/tr>\n | ||||||
52<\/td>\n | 10.9 Relevant standards 10.10 Solid state nuclear magnetic resonance crystallography 10.11 Raman crystallography 10.12 Relevant standards 11 Optical properties measurands 11.1 General <\/td>\n<\/tr>\n | ||||||
53<\/td>\n | 11.2 Measurands 11.3 Spectroscopy techniques <\/td>\n<\/tr>\n | ||||||
54<\/td>\n | 11.4 Relevant standards 12 Electrical and electronic measurands 12.1 Measurands <\/td>\n<\/tr>\n | ||||||
55<\/td>\n | 12.2 Techniques 12.2.1 2- or 4-point conductance measurements 12.2.2 Angle-resolved ultraviolet photoemission spectroscopy 12.2.3 Scanning tunnelling microscopy 12.2.4 Conductive atomic force microscopy <\/td>\n<\/tr>\n | ||||||
56<\/td>\n | 12.2.5 Piezoforce microscopy 13 Magnetic measurands 13.1 General 13.2 Measurands <\/td>\n<\/tr>\n | ||||||
57<\/td>\n | 13.3 Techniques 13.3.1 Superconducting quantum interference device <\/td>\n<\/tr>\n | ||||||
58<\/td>\n | 13.3.2 Vibrating sample magnetometer 13.3.3 M\u00f6ssbauer spectroscopy 13.3.4 Electron paramagnetic resonance spectroscopy 13.3.5 Magneto-optical Kerr-effect 13.3.6 Magnetic force microscopy 13.3.7 Scanning Hall effect microscopy <\/td>\n<\/tr>\n | ||||||
59<\/td>\n | 13.3.8 Spin-polarized scanning tunnelling microscopy 13.3.9 Relevant standards 14 Thermal measurands 14.1 Measurands 14.2 Techniques 14.2.1 Measurement of specific heat capacity 14.2.2 Scanning thermal microscopy <\/td>\n<\/tr>\n | ||||||
60<\/td>\n | 14.3 Relevant standard 15 Other performance related measurands 15.1 General 15.2 Powders \u2014 Dustiness 15.2.1 Measurands 15.2.2 Relevant standards <\/td>\n<\/tr>\n | ||||||
61<\/td>\n | 15.3 Liquid dispersions 15.3.1 Measurands 15.3.2 Viscosity <\/td>\n<\/tr>\n | ||||||
63<\/td>\n | 15.3.3 Dispersibility 15.3.4 Relevant standard 15.3.5 Solubility and rate of dissolution <\/td>\n<\/tr>\n | ||||||
64<\/td>\n | 15.3.6 Relevant standards 15.4 Mechanical properties 15.4.1 General <\/td>\n<\/tr>\n | ||||||
65<\/td>\n | 15.4.2 Measurement of elastic constants by static methods 15.4.3 Relevant standards 15.4.4 Measurement of elastic constants by dynamic methods <\/td>\n<\/tr>\n | ||||||
66<\/td>\n | 15.4.5 Relevant standards 15.4.6 Measurement of elastic and plastic properties by instrumented indentation methods 15.4.7 Relevant standards 15.4.8 Measurement of surface properties and wear <\/td>\n<\/tr>\n | ||||||
67<\/td>\n | 15.4.9 Relevant standard <\/td>\n<\/tr>\n | ||||||
68<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Nanotechnologies. Requirements and recommendations for the identification of measurands that characterise nano-objects and materials that contain them<\/b><\/p>\n |