IEEE C62.36 2016
$80.17
IEEE Standard Test Methods for Surge Protectors and Protective Circuits Used in Information and Communications Technology (ICT) Circuits, and Smart Grid Data Circuits
Published By | Publication Date | Number of Pages |
IEEE | 2016 | 150 |
Revision Standard – Active. Surge protectors for application on multiconductor balanced or unbalanced information and communications technology (ICT) circuits and smart grid data circuits are addressed in this standard. These surge protectors are designed to limit voltage surges, current surges, or both. The surge protectors covered are generally multiple-component series or parallel combinations of linear or nonlinear elements, packaged or organized for the purpose of limiting voltage, current, or both. The methods of testing and criteria (where appropriate) for the characteristics and ratings of surge protectors used in ICT circuits and smart grid data circuits are also described in this standard. Packaged single gas tube, air gap, varistor, or avalanche junction surge-protective components are not covered by this standard, but rathere are covered by IEEE Std C62.31™, IEEE Std C62.32™, IEEE Std C62.33™, and IEEE Std C62.35™, respectively. Specifically excluded from this standard are test methods for low-voltage power circuit applications. For protection of wire-line communication facilities under the specialized conditions found at power stations, consult IEEE Std 487™.
PDF Catalog
PDF Pages | PDF Title |
---|---|
1 | IEEE Std C62.36™-2016 Front cover |
2 | Title page |
4 | Important Notices and Disclaimers Concerning IEEE Standards Documents |
9 | Contents |
11 | IMPORTANT NOTICE 1. Scope |
12 | 2. Normative references 3. Definitions, acronyms, and abbreviations 3.1 Definitions |
13 | 3.2 Acronyms and abbreviations |
14 | 4. Service conditions 4.1 Normal service conditions 4.1.1 Environmental conditions |
15 | 4.1.2 Physical properties 4.1.3 System conditions 4.1.4 Surge rating of the surge protector under system conditions 4.2 Unusual service conditions 4.2.1 Environmental conditions |
16 | 4.2.2 Physical conditions 4.2.3 System conditions 4.3 Radiation 5. Basic configurations |
18 | 6. Standard design test procedure 6.1 Standard design test criteria 6.2 Statistical procedures 6.3 Test conditions 6.4 Test measurements 7. Surge protector characteristics 7.1 General |
19 | 7.2 DC series resistance 7.2.1 Background 7.2.2 Purpose 7.2.3 Equipment 7.2.4 Protector states subject to test 7.2.5 Procedures 7.2.6 Alternative methods 7.2.7 Suggested test data |
20 | 7.2.8 Requirement 7.2.9 Comment 7.3 Capacitance 7.3.1 Background 7.3.1.1 General |
21 | 7.3.1.2 Voltage-dependent capacitance |
22 | 7.3.1.3 Separating out the individual capacitive components |
23 | 7.3.2 Equipment 7.3.3 Equipment states subject to test |
24 | 7.3.4 Procedures 7.3.5 Alternative methods 7.3.6 Suggested test data 7.3.7 Requirements 7.3.8 Comments |
25 | 7.4 Inductance 7.4.1 Background 7.4.2 Purpose 7.4.3 Equipment 7.4.4 Protector states subject to test |
26 | 7.4.5 Procedures 7.4.6 Alternative methods 7.4.7 Suggested test data |
27 | 7.4.8 Requirements 7.4.9 Comment 7.5 Insulation resistance (IR) test 7.5.1 Background |
28 | 7.5.2 Purpose 7.5.3 Equipment 7.5.4 Protector states subject to test 7.5.5 Procedures |
29 | 7.5.6 Alternative methods 7.5.7 Suggested test data 7.5.8 Requirements 7.5.9 Comment 7.6 Standby current test 7.6.1 Background |
31 | 7.6.2 Purpose 7.6.3 Equipment 7.6.4 Protector states subject to test 7.6.5 Procedures |
32 | 7.6.6 Alternative methods 7.6.7 Suggested test data 7.6.8 Requirements 7.6.9 Comment |
33 | 7.7 DC ringing current 7.7.1 Background 7.7.2 Purpose 7.7.3 Equipment 7.7.4 Protector states subject to test |
34 | 7.7.5 Procedures 7.7.6 Alternative generators |
35 | 7.7.7 Suggested test data 7.7.8 Requirements 7.7.9 Comments 7.8 Distortion 7.8.1 Background |
36 | 7.8.2 Purpose 7.8.3 Equipment 7.8.4 Protector states subject to test |
37 | 7.8.5 Procedures |
39 | 7.8.6 Alternative methods |
40 | 7.8.7 Suggested test data 7.8.8 Requirements 7.8.9 Comments 7.9 Transmission properties: insertion loss, return loss, phase shift |
47 | 7.10 Longitudinal conversion transfer loss (LCTL) |
50 | 7.11 Voltage reset [electronic current limiters (ECLs)] |
53 | 7.12 Impulse reset |
58 | 7.13 Transition current test for thermally activated components |
61 | 7.14 Time-to-trip test for thermally activated components |
64 | 7.14.6.1 Equipment 7.14.6.2 Procedures |
66 | 7.15 Transverse surge generation |
70 | 7.16 DC-limiting voltage |
74 | 7.16.7.1 Equipment 7.16.7.2 Procedures |
75 | 7.17 Impulse-limiting voltage |
79 | 7.18 In-line surge protector: protected port surge current let-through |
81 | 7.19 In-line surge protector: surge series resistance |
84 | 7.20 In-line surge protector: protected port ground potential rise (GPR) |
86 | 7.20.5 Differential GPR test levels |
87 | 7.21 In-line surge protector: protected port ground lead inductive voltage spike |
88 | 7.21.5.1 Figure 42 circuit values |
89 | 7.21.5.2 Procedures |
90 | 8. Preferred surge protector ratings under specified conditioning 8.1 Surge protector ratings under environmental cycling with impulse surges |
94 | 8.2 Surge protector ratings under environmental cycling with ac exposure |
96 | 8.2.8 Requirement |
98 | 8.3 Surge protector ratings under ac life (durability) |
100 | 8.4 Surge protector ratings under impulse life (durability) |
104 | 8.5 Surge protector ratings under maximum single-impulse discharge |
106 | 9. Failure modes |
107 | Annex A (informative) Examples of internal arrangements of sur |
110 | Annex B (informative) Test measurement techniques B.1 Introduction B.2 Oscilloscopes |
111 | B.3 Voltage measurements |
112 | B.4 Current measurements |
113 | Annex C (informative) Impulse generators C.1 Introduction C.2 Types of impulse generator C.3 Impulse generator parameters |
116 | C.4 Impulse generators typically used for surge protector testing |
118 | C.5 Impulse generator circuits |
122 | C.6 Combination wave generators |
124 | C.7 Expanding single-output generators to multiple output |
127 | C.8 Generator variants |
132 | Annex D (informative) Cable discharge events D.1 Background D.2 Event characteristics |
133 | D.3 Test methods |
135 | Annex E (informative) GDT-based surge protector oscillation test E.1 Background |
136 | E.2 Purpose E.3 Equipment E.4 Equipment states subject to test |
137 | E.5 Procedures E.6 Alternative methods |
138 | E.7 Suggested data |
139 | E.8 Comments |
140 | Annex F (informative)Multiport surge protector F.1 Introduction F.2 Individual service protection |
141 | F.3 Standards that address multiport coupling |
143 | Annex G (informative) Comments on characteristics and ratings |
144 | Annex H (informative) Signal transformers voltage-time product H.1 Background H.2 Purpose H.3 Equipment H.4 Protector states subject to test H.5 Procedures |
145 | H.6 Alternative method H.7 Suggested test data H.8 Requirement |
146 | H.9 Comments |
147 | Annex I (informative) Bibliography |
150 | Back cover |