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IEC 60749-18:2019

IEC 60749-18:2019

$43.55

Semiconductor devices – Mechanical and climatic test methods – Part 18: Ionizing radiation (total dose)

Published By Publication Date Number of Pages
IEC 2019-04-10 48
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IEC 60749-18:2019 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source. Other suitable radiation sources can be used. This document addresses only steady-state irradiations, and is not applicable to pulse type irradiations. It is intended for military- and aerospace-related applications. It is a destructive test. This edition includes the following significant technical changes with respect to the previous edition:
– updates to subclauses to better align the test method with MIL-STD 883J, method 1019, including the use of enhanced low dose rate sensitivity (ELDRS) testing;
– addition of a Bibliography, which includes ASTM standards relevant to this test method.

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IEC 60749-18:2019
$43.55