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IEC 60749-13:2018

IEC 60749-13:2018

$22.75

Semiconductor devices – Mechanical and climatic test methods – Part 13: Salt atmosphere

Published By Publication Date Number of Pages
IEC 2018-02-15 32
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IECĀ 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment.Ā The salt atmosphere test is considered destructive.
This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures).

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IEC 60749-13:2018
$22.75